New light for electron microscopy

The lab of Thomas Juffmann, together with researchers from the University of Siegen, has developed a new technique that combines electron microscopy and laser technology to enable programmable, arbitrary shaping of electron beams. It can potentially be used for optimizing electron optics and for adaptive electron microscopy, with applications in structural biology and materials science. The technology maximizes sensitivity while minimizing beam-induced damage. The results are published in Physics Review X.

Recent experiments at the University of Vienna show that light (red) can be used to arbitrarily shape electron beams (yellow), opening new possibilities in electron microscopy and metrology. ©, University of Vienna

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